X-ray diffraction measurements (XRD)

Description

The phenomenon of X-ray diffraction allows the identification of the phase composition of the mixtures of crystals, crystal orientation analysis of crystallographic texture and measurements of lattice parameters. To measure the intensity of X-ray diffraction we use MRD X-ray diffractometer from Panalytical company equipped with a new generation pixcel detector. Interpretation of X-ray diffraction is the essence of phase analysis, texture analysis, determining the parameters of the network, and enables the analysis of a variety of other phenomena occurring in the crystal structures.

Measurement

• X-ray powder diffraction
  • Lattice constants parameters
  • Phase analysis
  • Structural analysis
• High resolution X-ray diffraction
  • Stress analysis for layers and multilayers
  • Crystal texture analysis
  • Resiprocal space mapping
  • Lattice constants parameters
• Reflectivity
  • roughness layers and multilayers

Multifunctional Eulerian cradle

• the range of the chi circle: ±90°, minimum step 0.01°,
• the range of the phi: -2 × 360° circle: ±90°, minimum step 0.02°,
• the range of translation X and Y: 100 mm, step size 0.01 mm,
• the range of translation Z: 11 mm, step size 1 µm